Paper published in the Measurement journal (200 pts)

Paper from the Department is published in the Measurement Journal. The paper entitled "Defect-mediated sputtering process of boron nitride during high incident angle low-energy ion bombardment" is a collaborating effort of Dr. Michałowski group from the Institute of Microelectronics and Photonics and the group of Prof. Postawa from our Department.  Congratulations!!!

https://doi.org/10.1016/j.measurement.2021.109487